Raj, K., Mukesh, K., Lokesh, K. G., Vivek, K., Anjali, Supriya, S., … Ajar, N. Y. (2025). Trait profiling for yield improvement in Indian mustard using multivariate and radar plot analyses. Plant Science Today, 12(sp1). https://doi.org/10.14719/pst.9222 (Original work published August 14, 2025)