RAJ, K; MUKESH, K; LOKESH, K G; VIVEK, K; ANJALI; SUPRIYA, S; NIRDESH, K C; SOYAL, K; AJAR, N Y. Trait profiling for yield improvement in Indian mustard using multivariate and radar plot analyses. Plant Science Today, [S. l.], v. 12, n. sp1, 2025. DOI: 10.14719/pst.9222. Disponível em: https://horizonepublishing.com/index.php/PST/article/view/9222. Acesso em: 5 dec. 2025.